openEPDA MDF format

Summary

This document contains draft description of the Measurement Description File (MDF), which is used for hardware- and setup-independent configuring of the measurements to be performed on Photonic Integrated Circuits (PIC).

Introduction

MDF is configuration file that contains data regarding the measurement sequences that are to be performed on a specific die. Therefore it is linked to a specific design (cell), meaning that for every new die design, also the applicable MDF needs to be composed. A new MDF needs also to be composed if a different measurement sequence has to be performed on the same die.

Being a YAML file, its content is human readable and intuitive in its structure. It provides all necessary information starting from cell identification data, which is to be crosschecked with other configuration files, up to the very essence of the file which is the definition of the measurements themselves. More details regarding YAML syntax can be found here: https://yaml.org/spec/1.2/spec.html.

License

openEPDA MDF format is available under CC BY-SA 4.0 license.

This is Creative Commons Attribution-ShareAlike 4.0 International (CC BY-SA 4.0). See full license text here: CC BY-SA 4.0.

More details on openEPDA view on standards licensing are available on Licensing policy page.

Specification

The standard specifies the contents of the file, which means which attributes have to be defined in the file. Some attributes are required and some are optional. There are also reserved attributes which start with an underscore.

Besides the contents, the standard also defines the actual representation of the data, which is YAML format. More information regarding the YAML syntax can be found here: https://yaml.org/spec/1.2/spec.html.